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An ion beam is a type of charged particle beam consisting of ions. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. -- Wikipedia

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Sage’s front-side/back-side IC editing with coaxial photon and ion opt

Sage’s front-side/back-side IC editing with coaxial photon and ion optics. Precision copper etching over SiO2 and low-k dielectrics
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Contact us for any questions | SAGE Failure Analysis Lab

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Particle Sizing by Dynamic Light Scattering (DLS) Sage Analytical La

Dynamic Light Scattering (DLS) technique Zeta Potential Analysis by Electrophoretic Light Scattering (ELS)
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Counterfeit Analysis Electronic Components IC Failure Lab

Counterfeit electronic components are electronic parts that are misrepresented as to their origins or Quality. Call us for a quote.
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Electrical Characterization Microprobing AFP Nanoprobing

We have tools to characterize all manners of electrical failures. Electrical characterization is essential throughout the failure analysis process.
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ESD CDM Testing San Diego, California – SAGE Analytical Lab

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ESD HBM and MM Testing San Diego, California – SAGE Analytical Lab

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Comprehensive IC Failure Analysis | Sagefalab San Diego, CA

At Sage Analytical Laboratories we are equipped to provide comprehensive IC failure analysis services in a timely and precise fashion.
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